Compositional Fault Propagation Analysis in Embedded Systems using Abstract Interpretation
Author: | Christian Bartsch, Stephan Wilhelm, Daniel Kastner, Dominik Stoffel, Wolfgang Kunz |
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URL: | https://ieeexplore.ieee.org/document/9611333 |
DOI: | https://doi.org/10.1109/ITC50571.2021.00057 |
ISBN: | 978-1-6654-1695-5 |
ISBN: | 978-1-6654-1696-2 |
ISSN: | 2378-2250 |
Parent Title (English): | 2021 IEEE International Test Conference (ITC) |
Publisher: | IEEE |
Place of publication: | Piscataway, NJ |
Document Type: | Conference Proceeding |
Language: | English |
Publication year: | 2021 |
Year of first Publication: | 2021 |
Release Date: | 2024/10/15 |
Volume: | 259 |
Page Number: | 10 |
First Page: | 409 |
Last Page: | 418 |
Faculties / Organisational entities: | RPTU in Kaiserslautern / Fachbereich Elektrotechnik und Informationstechnik / Entwurf Informationstechnischer Systeme |
Open access state: | Closed Access |
RPTU: | Kaiserslautern |
Created at the RPTU: | Yes |