Compositional Fault Propagation Analysis in Embedded Systems using Abstract Interpretation

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Author:Christian Bartsch, Stephan Wilhelm, Daniel Kastner, Dominik Stoffel, Wolfgang Kunz
URL:https://ieeexplore.ieee.org/document/9611333
DOI:https://doi.org/10.1109/ITC50571.2021.00057
ISBN:978-1-6654-1695-5
ISBN:978-1-6654-1696-2
ISSN:2378-2250
Parent Title (English):2021 IEEE International Test Conference (ITC)
Publisher:IEEE
Place of publication:Piscataway, NJ
Document Type:Conference Proceeding
Language:English
Publication year:2021
Year of first Publication:2021
Release Date:2024/10/15
Volume:259
Page Number:10
First Page:409
Last Page:418
Faculties / Organisational entities:RPTU in Kaiserslautern / Fachbereich Elektrotechnik und Informationstechnik / Entwurf Informationstechnischer Systeme
Open access state:Closed Access
RPTU:Kaiserslautern
Created at the RPTU:Yes