Nano Security: From Nano-Electronics to Secure Systems

Export metadata

Additional Services

Search Google Scholar
Metadaten
Author:Ilia Polian, Frank Altmann, Tolga Arul, Christian Boit, Ralf Brederlow, Lucas Davi, Rolf Drechsler, Nan Du, Thomas Eisenbarth, Tim Guneysu, Sascha Hermann, Matthias Hiller, Rainer Leupers, Farhad Merchant, Thomas Mussenbrock, Stefan Katzenbeisser, Akash Kumar, Wolfgang Kunz, Thomas Mikolajick, Vivek Pachauri, Jean-Pierre Seifert, Frank Sill Torres, Jens Trommer
URL:https://ieeexplore.ieee.org/document/9474187
DOI:https://doi.org/10.23919/DATE51398.2021.9474187
ISBN:978-3-9819263-5-4
ISBN:978-1-7281-6336-9
ISSN:1558-1101
Parent Title (English):2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Publisher:IEEE
Place of publication:Piscataway, NJ
Document Type:Conference Proceeding
Language:English
Publication year:2021
Year of first Publication:2021
Release Date:2024/10/24
Volume:24
Page Number:6
First Page:1334
Last Page:1339
Faculties / Organisational entities:RPTU in Kaiserslautern / Fachbereich Elektrotechnik und Informationstechnik / Entwurf Informationstechnischer Systeme
Open access state:Closed Access
RPTU:Kaiserslautern
Created at the RPTU:Yes