All-Electronic High-Resolution Terahertz Thickness Measurements
| Author: | Nina S. Schreiner, Wolfgang Sauer-Greff, Ralph Urbansky, Fabian Friederich |
|---|---|
| URL: | https://ieeexplore.ieee.org/document/8510060 |
| DOI: | https://doi.org/10.1109/IRMMW-THz.2018.8510060 |
| ISBN: | 978-1-5386-3809-5 |
| ISBN: | 978-1-5386-3808-8 |
| ISBN: | 978-1-5386-3810-1 |
| ISSN: | 2162-2035 |
| Parent Title (English): | 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) |
| Publisher: | IEEE |
| Place of publication: | Piscataway, NJ |
| Document Type: | Conference Proceeding |
| Language: | English |
| Publication year: | 2018 |
| Year of first Publication: | 2018 |
| Release Date: | 2024/11/12 |
| Page Number: | 2 |
| First Page: | 1 |
| Last Page: | 2 |
| Faculties / Organisational entities: | RPTU in Kaiserslautern / Fachbereich Physik / Optische Technologien und Photonik |
| Open access state: | Closed Access |
| RPTU: | Kaiserslautern |
| Created at the RPTU: | Yes |