Retention Time Measurements and Modelling of Bit Error Rates of WIDE I/O DRAM in MPSoCs
| Author: | Christian Weis, Matthias Jung, Peter Ehses, Cristiano Santos, Pascal Vivet, Sven Goossens, Martijn Koedam, Norbert WehnORCiD |
|---|---|
| URL: | https://ieeexplore.ieee.org/document/7092439?arnumber=7092439 |
| DOI: | https://doi.org/10.7873/date.2015.0258 |
| ISBN: | 978-3-9815-3705-5 |
| ISBN: | 978-3-9815-3704-8 |
| ISSN: | 1558-1101 |
| Parent Title (English): | Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 |
| Secondary publication (full text): | https://past.date-conference.com/proceedings-archive/2015/pdf/0258.pdf |
| Publisher: | IEEE Conference Publications |
| Place of publication: | New Jersey |
| Document Type: | Conference Proceeding |
| Language: | English |
| Publication year: | 2015 |
| Year of first Publication: | 2015 |
| Release Date: | 2024/12/19 |
| Page Number: | 6 |
| First Page: | 495 |
| Last Page: | 500 |
| Faculties / Organisational entities: | RPTU in Kaiserslautern / Fachbereich Elektrotechnik und Informationstechnik / Entwurf Mikroelektronischer Systeme |
| Open access state: | Grün Open-Access |
| RPTU: | Kaiserslautern |
| Created at the RPTU: | Yes |