Exploiting expendable process-margins in DRAMs for run-time performance optimization
| Author: | Karthik Chandrasekar, Sven Goossens, Christian Weis, Martijn Koedam, Benny Akesson, Norbert Wehn, Kees Goossens |
|---|---|
| URL: | https://ieeexplore.ieee.org/document/6800387?arnumber=6800387 |
| DOI: | https://doi.org/10.7873/DATE2014.186 |
| ISBN: | 978-3-9815370-2-4 |
| ISSN: | 1558-1101 |
| Parent Title (English): | Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 |
| Secondary publication (full text): | https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=dc8bd83ea02f58005fa132cbb7282d339066e31b |
| Publisher: | IEEE Conference Publications |
| Place of publication: | New Jersey |
| Document Type: | Conference Proceeding |
| Language: | English |
| Publication year: | 2014 |
| Year of first Publication: | 2014 |
| Release Date: | 2024/12/20 |
| Page Number: | 6 |
| First Page: | 1 |
| Last Page: | 6 |
| Faculties / Organisational entities: | RPTU in Kaiserslautern / Fachbereich Elektrotechnik und Informationstechnik / Entwurf Mikroelektronischer Systeme |
| Open access state: | Grün Open-Access |
| RPTU: | Kaiserslautern |
| Created at the RPTU: | Yes |