MetaFS: Model-driven Fault Simulation Framework
| Author: | Endri Kaja, Nicolas Gerlin, Monideep Bora, Keerthikumara Devarajegowda, Dominik Stoffel, Wolfgang KunzORCiD, Wolfgang Ecker |
|---|---|
| URL: | https://ieeexplore.ieee.org/document/9962369 |
| DOI: | https://doi.org/10.1109/DFT56152.2022.9962369 |
| ISBN: | 978-1-6654-5938-9 |
| ISBN: | 978-1-6654-5937-2 |
| ISBN: | 978-1-6654-5939-6 |
| ISSN: | 2765-933X |
| Parent Title (English): | 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
| Publisher: | IEEE |
| Place of publication: | Piscataway, NJ |
| Document Type: | Conference Proceeding |
| Language: | English |
| Publication year: | 2022 |
| Year of first Publication: | 2022 |
| Release Date: | 2025/01/21 |
| Page Number: | 4 |
| First Page: | 1 |
| Last Page: | 4 |
| Faculties / Organisational entities: | RPTU in Kaiserslautern / Fachbereich Elektrotechnik und Informationstechnik / Entwurf Informationstechnischer Systeme |
| Open access state: | Closed Access |
| RPTU: | Kaiserslautern |
| Created at the RPTU: | Yes |