A Cross-Layer Technology-Based Study of How Memory Errors Impact System Resilience
| Author: | Veit B. Kleeberger, Christina Gimmler-Dumont, Christian Weis, Andreas Herkersdorf, Daniel Mueller-Gritschneder, Sani R. Nassif, Ulf Schlichtmann, Norbert WehnORCiD |
|---|---|
| URL: | https://ieeexplore.ieee.org/document/6527887 |
| DOI: | https://doi.org/10.1109/MM.2013.67 |
| ISSN: | 1937-4143 |
| Journal: | IEEE Micro |
| Publisher: | IEEE |
| Document Type: | Research Article |
| Language: | English |
| Year of first Publication: | 2013 |
| Release Date: | 2025/02/05 |
| Volume: | 33 |
| Issue: | 4 |
| Page Number: | 10 |
| First Page: | 46 |
| Last Page: | 55 |
| Faculties / Organisational entities: | RPTU in Kaiserslautern / Fachbereich Elektrotechnik und Informationstechnik / Entwurf Mikroelektronischer Systeme |
| Open access state: | Closed Access |
| RPTU: | Kaiserslautern |
| Research funding: | DFG |
| Created at the RPTU: | Yes |