Safety across the HW/SW interface - Can formal methods meet the challenge?

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Author:Christian Bartsch, Carlos Villarraga, Dominik Stoffel, Wolfgang Kunz
URL:https://ieeexplore.ieee.org/document/7829707
DOI:https://doi.org/10.1109/ISICIR.2016.7829707
ISBN:978-1-4673-9019-4
ISBN:978-1-4673-9018-7
ISBN:978-1-4673-9020-0
Parent Title (English):2016 International Symposium on Integrated Circuits (ISIC)
Publisher:IEEE
Place of publication:Piscataway, NJ
Document Type:Conference Proceeding
Language:English
Publication year:2016
Year of first Publication:2016
Release Date:2025/12/17
Page Number:3
First Page:1
Last Page:3
Faculties / Organisational entities:RPTU in Kaiserslautern / Fachbereich Elektrotechnik und Informationstechnik / Entwurf Informationstechnischer Systeme
Open access state:Closed Access
RPTU:Kaiserslautern
Created at the RPTU:Yes